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US Patent 10540783 Image analysis useful for patterned objects

Patent 10540783 was granted and assigned to Illumina on January, 2020 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
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Current Assignee
Illumina
Illumina
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Date Filed
October 31, 2014
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Date of Patent
January 21, 2020
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Patent Applicant
Illumina
Illumina
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Patent Application Number
14530299
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Patent Citations Received
‌
US Patent 11249025 System and method with fiducials in non-rectilinear layouts
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‌
US Patent 11835460 System and method with fiducials having offset layouts
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‌
US Patent 11427868 System and method with fiducials of non-closed shapes
‌
US Patent 11262307 System and method with reflective fiducials for locating or registering locations receiving biological samples in successive cycles of fluorescent imaging
Patent Inventor Names
M. Shane Bowen
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John A. Moon
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John S. Vieceli
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Stephen Tanner
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
10540783
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Patent Primary Examiner
‌
Gandhi Thirugnanam
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