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US Patent 10575800 Increased spatial resolution for photon-counting edge-on x-ray detectors

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Patent Jurisdiction

United States Patent and Trademark Office

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Patent Number

Patent Inventor Names

Mats Danielsson0

Jacob J Wikner0

Date of Patent

March 3, 2020

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Patent Application Number

154533150

Date Filed

March 8, 2017

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Patent Citations Received

US Patent 11071514 Imaging system with energy sensing and method for operation

Patent Primary Examiner

0

Patent abstract

There is provided a method and an arrangement for determining a position of interaction of a photon in an individual detector diode of a photon-counting x-ray detector. The method includes determining the position of interaction in the detector diode based on pulse characteristics of a pulse generated by the individual detector diode in response to the photon interaction.

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