US Patent 10578566 X-ray emission spectrometer system
Patent 10578566 was granted and assigned to Sigray, Inc. on March, 2020 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
April 1, 2019
Date of Patent
March 3, 2020
Patent Applicant
Patent Application Number
16371606
Patent Citations
•••
Patent Citations Received
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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