US Patent 10585173 Systems and methods for enhanced ToF resolution

Systems and methods for projecting and detecting light are disclosed. Systems and methods for determining surface depth information using Time-of-Flight (“ToF”) detectors configured to measure time-of-flight in connection with flood light reflections, structured light reflections, and/or a fusion of both (e.g., in a selective, controlled, and/or patterned manner) are disclosed. Some portions of this disclosure also relate to embodiments of the technology configured for operation in connection with a switchable diffuser.