US Patent 10591290 Survey system

Provided is a survey system capable of acquiring point group data of a three-dimensional object desired to be measured without complicated setting. A survey system includes a surveying instrument including a tracking section that tracks a target by emitting tracking light and receiving the tracking light reflected on the target, and a scanner that rotates horizontally and integrally with the surveying instrument and performs scanning around a single axis in a vertical direction, and the scanner and the tracking section are offset in the horizontal direction. Therefore, a scanning line (SL) does not match the target, and is always controlled around the target.