Patent attributes
A projection pattern creation apparatus is configured to capture an image of a projection pattern projected from a pattern projection device by an imaging device to measure a three-dimensional position and/or a shape of an object. The projection pattern creation apparatus includes: a projection pattern deformation unit configured to reproduce deformation when a projected projection pattern is included in an image captured by the imaging device on the basis of characteristics of optical systems of the pattern projection device and the imaging device, and/or a positional relation between the pattern projection device and the imaging device and generate a deformation projection pattern; and a first projection pattern improvement unit configured to generate a second projection pattern obtained by improving a first projection pattern, on a basis of a first deformation projection pattern generated when the first projection pattern is projected toward evaluation surfaces having different positions and inclinations.
