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US Patent 10594306 Delay circuit with dual delay resolution regime

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
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Date Filed
April 25, 2017
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Date of Patent
March 17, 2020
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Patent Application Number
15496924
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Patent Citations Received
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US Patent 11245404 Phase lock loop circuit based signal generation in an optical measurement system
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US Patent 11607132 Temporal resolution control for temporal point spread function generation in an optical measurement system
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US Patent 11630310 Wearable devices and wearable assemblies with adjustable positioning for use in an optical measurement system
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US Patent 11645483 Phase lock loop circuit based adjustment of a measurement time window in an optical measurement system
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US Patent 11771362 Integrated detector assemblies for a wearable module of an optical measurement system
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US Patent 12059270 Systems and methods for noise removal in an optical measurement system
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US Patent 11398578 Photodetector systems with low-power time-to-digital converter architectures to determine an arrival time of photon at a photodetector based on event detection time window
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US Patent 11437538 Wearable brain interface systems including a headgear and a plurality of photodetector units each housing a photodetector configured to be controlled by a master control unit
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US Patent 11857348 Techniques for determining a timing uncertainty of a component of an optical measurement system
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US Patent 11864867 Control circuit for a light source in an optical measurement system by applying voltage with a first polarity to start an emission of a light pulse and applying voltage with a second polarity to stop the emission of the light pulse
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•••
Patent Inventor Names
Marc Péralte Dandin
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
10594306
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Patent Primary Examiner
John R. Lee
John R. Lee
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