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US Patent 10610188 X-ray imaging condition modification method and x-ray system
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Patent
Date Filed
June 8, 2017
Date of Patent
April 7, 2020
Patent Application Number
15617527
Patent Citations
US Patent 10219771 Radiographic imaging apparatus, method of controlling radiographic imaging apparatus and computed tomography apparatus
US Patent 10188366 X-ray irradiation controlling device
US Patent 10383583 X-ray CT apparatus
US Patent 10028719 Adjusting an X-ray parameter of an X-ray unit
US Patent 10172584 Method for generating approximate function of total MTF of X-ray image, based on conditions for imaging with X-ray
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
10610188
Patent Primary Examiner
Allen C. Ho
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