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US Patent 10627723 Yield estimation and control
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Edits on 19 Sep, 2024
"update inverses"
Golden AI
edited on 19 Sep, 2024
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+1
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Patent Citations Received
US Patent 12092965 Process variability aware adaptive inspection and metrology
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Edits on 21 Aug, 2024
"update inverses"
Golden AI
edited on 21 Aug, 2024
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent Citations Received
US Patent 12067340 Computational wafer inspection
0
Edits on 28 Jun, 2023
"update inverses"
Golden AI
edited on 28 Jun, 2023
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent Citations Received
US Patent 11687007 Method for decision making in a semiconductor manufacturing process
0
Edits on 25 May, 2023
"Remove website redirecting to Patent Public Search front page"
Golden AI
edited on 25 May, 2023
Edits made to:
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-1
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=10627723
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Edits on 27 Apr, 2023
"update citations for inverse infoboxes"
Golden AI
edited on 27 Apr, 2023
Infobox
Patent Citations Received
US Patent 11003093 Process variability aware adaptive inspection and metrology
0
Edits on 27 Mar, 2023
"Entity importer update"
Golden AI
edited on 27 Mar, 2023
Infobox
Is a
Patent
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
10627723
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Date of Patent
April 21, 2020
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Patent Application Number
15104517
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Date Filed
November 14, 2014
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=10627723
0
Patent Citations Received
US Patent 11003093 Process variability aware adaptive inspection and metrology
0
Patent Primary Examiner
Huan Hoang
0
Edits on 25 Sep, 2022
"update citations for inverse infoboxes"
Golden AI
edited on 25 Sep, 2022
Infobox
Patent Citations Received
US Patent 11003093 Process variability aware adaptive inspection and metrology
0
Edits on 8 Jun, 2022
"Entity importer update"
Golden AI
edited on 8 Jun, 2022
Edits made to:
Infobox
(
+1
properties)
Infobox
Website URL
https://pdfpiw.uspto.gov/.piw?Docid=10627723
Edits on 11 Feb, 2022
"update inverses"
Golden AI
edited on 11 Feb, 2022
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent citations received
US Patent 11003093 Process variability aware adaptive inspection and metrology
Edits on 2 Feb, 2022
"Created via: Entity Importer"
Golden AI
created this topic on 2 Feb, 2022
Edits made to:
Infobox
(
+7
properties)
US Patent 10627723 Yield estimation and control
Infobox
Is a
Patent
Patent jurisdiction
United States Patent and Trademark Office
Patent number
10627723
Date of patent
April 21, 2020
Patent application number
15104517
Date Filed
November 14, 2014
Patent primary examiner
Huan Hoang
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