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US Patent 10658486 Mitigation of time dependent dielectric breakdown

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Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

Date of Patent

May 19, 2020

Patent Application Number

15599045

Date Filed

May 18, 2017

Patent Citations

US Patent 10164039 Semiconductor device having metal gate

US Patent 10177148 Integrated circuit devices and methods of fabricating such devices

Patent Primary Examiner

Mary A Wilczewski

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