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US Patent 10665419 Intelligent pre-scan in scanning transmission charged particle microscopy
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Edits on 25 May, 2023
"Remove website redirecting to Patent Public Search front page"
Golden AI
edited on 25 May, 2023
Edits made to:
Infobox
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-1
properties)
Infobox
Official Website
https://pdfpiw.uspto.gov/.piw?Docid=10665419
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Edits on 25 Mar, 2023
"update citations for inverse infoboxes"
Golden AI
edited on 25 Mar, 2023
Infobox
Patent Citations
US Patent 10403469 Method of performing tomographic imaging in a charged-particle microscope
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Edits on 27 Sep, 2022
"Entity importer update"
Golden AI
edited on 27 Sep, 2022
Infobox
Is a
Patent
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Patent Applicant
FEI Company
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Current Assignee
FEI Company
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
10665419
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Date of Patent
May 26, 2020
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Patent Application Number
16282021
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Date Filed
February 21, 2019
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=10665419
0
Patent Citations
US Patent 10403469 Method of performing tomographic imaging in a charged-particle microscope
0
Patent Primary Examiner
David E Smith
0
Edits on 26 Sep, 2022
"update citations for inverse infoboxes"
Golden AI
edited on 26 Sep, 2022
Infobox
Patent Citations
US Patent 10403469 Method of performing tomographic imaging in a charged-particle microscope
0
Edits on 8 Jun, 2022
"Entity importer update"
Golden AI
edited on 8 Jun, 2022
Edits made to:
Infobox
(
+1
properties)
Infobox
Website URL
https://pdfpiw.uspto.gov/.piw?Docid=10665419
Edits on 3 Feb, 2022
"Created via: Entity Importer"
Golden AI
created this topic on 3 Feb, 2022
Edits made to:
Infobox
(
+10
properties)
US Patent 10665419 Intelligent pre-scan in scanning transmission charged particle microscopy
Infobox
Is a
Patent
Patent applicant
FEI Company
Current assignee
FEI Company
Patent jurisdiction
United States Patent and Trademark Office
Patent number
10665419
Date of patent
May 26, 2020
Patent application number
16282021
Date Filed
February 21, 2019
Patent citations
US Patent 10403469 Method of performing tomographic imaging in a charged-particle microscope
Patent primary examiner
David E Smith
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