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US Patent 10665499 Integrated circuit with airgaps to control capacitance

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Edits on 31 May, 2023
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edited on 31 May, 2023
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Patent Citations Received
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US Patent 11664333 Method of manufacturing die seal ring
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Edits on 21 May, 2023
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edited on 21 May, 2023
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=106654990
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Infobox
Is a
Patent
Patent
0
Patent Applicant
Intel
Intel
0
Current Assignee
Intel
Intel
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
106654990
Date of Patent
May 26, 2020
0
Patent Application Number
160213520
Date Filed
June 28, 2018
0
Official Website
https://pdfpiw.uspto.gov/.piw?Docid=106654990
Patent Citations
‌
US Patent 10062609 Semiconductor devices and methods of manufacturing the same
0
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US Patent 10163792 Semiconductor device having an airgap defined at least partially by a protective structure
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Patent Citations Received
‌
US Patent 10892235 Die seal ring and manufacturing method thereof
0
Patent Primary Examiner
‌
David A Zarneke
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edited on 26 Sep, 2022
Edits on 23 Sep, 2022
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edited on 23 Sep, 2022
Edits on 8 Jun, 2022
"Entity importer update"
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edited on 8 Jun, 2022
Edits made to:
Infobox (+1 properties)
Infobox
Website URL
https://pdfpiw.uspto.gov/.piw?Docid=10665499
Edits on 9 Feb, 2022
"update inverses"
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Golden AI
edited on 9 Feb, 2022
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Patent citations received
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US Patent 10892235 Die seal ring and manufacturing method thereof
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created this topic on 3 Feb, 2022
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 US Patent 10665499 Integrated circuit with airgaps to control capacitance

Infobox
Is a
Patent
Patent
Patent applicant
Intel
Intel
Current assignee
Intel
Intel
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
10665499
Date of patent
May 26, 2020
Patent application number
16021352
Date Filed
June 28, 2018
Patent citations
‌
US Patent 10062609 Semiconductor devices and methods of manufacturing the same
‌
US Patent 10163792 Semiconductor device having an airgap defined at least partially by a protective structure
Patent primary examiner
‌
David A Zarneke

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