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US Patent 10731971 Method of measuring 3D profile

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Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

Date of Patent

August 4, 2020

Patent Application Number

16684604

Date Filed

November 15, 2019

Patent Citations

US Patent 10332268 Image processing apparatus, generation method, and non-transitory computer-readable storage medium

US Patent 10634487 Method and system for optical three dimensional topography measurement

US Patent 10078907 Distance measurement apparatus, distance measurement method, and storage medium

US Patent 10415958 Measuring device

Patent Primary Examiner

Gordon J Stock, Jr.

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