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US Patent 10753887 X-ray CT measuring apparatus and interference prevention method thereof
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Edits on 23 May, 2023
"Remove website redirecting to Patent Public Search front page"
Golden AI
edited on 23 May, 2023
Edits made to:
Infobox
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-1
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Infobox
Official Website
https://pdfpiw.uspto.gov/.piw?Docid=10753887
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Edits on 28 Apr, 2023
"Entity importer update"
Golden AI
edited on 28 Apr, 2023
Infobox
Is a
Patent
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Patent Applicant
Mitutoyo
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Current Assignee
Mitutoyo
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
10753887
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Date of Patent
August 25, 2020
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Patent Application Number
16250167
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Date Filed
January 17, 2019
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=10753887
0
Patent Citations Received
US Patent 11353410 Material testing machine and radiation CT device
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Patent Primary Examiner
David P Porta
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Edits on 22 Mar, 2023
"update citations for inverse infoboxes"
Golden AI
edited on 22 Mar, 2023
Infobox
Patent Citations Received
US Patent 11353410 Material testing machine and radiation CT device
0
Edits on 26 Sep, 2022
"update citations for inverse infoboxes"
Golden AI
edited on 26 Sep, 2022
Infobox
Patent Citations Received
US Patent 11353410 Material testing machine and radiation CT device
0
Edits on 9 Jun, 2022
"update inverses"
Golden AI
edited on 9 Jun, 2022
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent citations received
US Patent 11353410 Material testing machine and radiation CT device
"Entity importer update"
Golden AI
edited on 8 Jun, 2022
Edits made to:
Infobox
(
+1
properties)
Infobox
Website URL
https://pdfpiw.uspto.gov/.piw?Docid=10753887
Edits on 6 Feb, 2022
"Created via: Entity Importer"
Golden AI
created this topic on 6 Feb, 2022
Edits made to:
Infobox
(
+9
properties)
US Patent 10753887 X-ray CT measuring apparatus and interference prevention method thereof
Infobox
Is a
Patent
Patent applicant
Mitutoyo
Current assignee
Mitutoyo
Patent jurisdiction
United States Patent and Trademark Office
Patent number
10753887
Date of patent
August 25, 2020
Patent application number
16250167
Date Filed
January 17, 2019
Patent primary examiner
David P Porta
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