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US Patent 10825648 Studying dynamic specimens in a transmission charged particle microscope

Patent 10825648 was granted and assigned to FEI Company on November, 2020 by the United States Patent and Trademark Office.

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Infobox (-1 properties)
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=1082564800
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Infobox
Is a
Patent
Patent
0
Patent Applicant
FEI Company
FEI Company
0
Current Assignee
FEI Company
FEI Company
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
108256480
Date of Patent
November 3, 2020
0
Patent Application Number
163640190
Date Filed
March 25, 2019
0
Official Website
https://pdfpiw.uspto.gov/.piw?Docid=108256480
Patent Citations
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US Patent 10014158 Innovative image processing in charged particle microscopy
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US Patent 10224174 Transmission charged particle microscope with imaging beam rotation
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US Patent 10446366 Imaging technique in scanning transmission charged particle microscopy
0
Patent Citations Received
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US Patent 11404244 High-resolution x-ray spectroscopy surface material analysis
0
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US Patent 11501951 X-ray imaging in cross-section using un-cut lamella with background material
0
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US Patent 11569061 Multibeam scanning apparatus and multibeam scanning method
0
Patent Primary Examiner
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David A. Vanore
0
Edits on 4 Apr, 2023
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edited on 1 Feb, 2023
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Infobox (+1 properties)
Infobox
Patent Citations Received
‌
US Patent 11569061 Multibeam scanning apparatus and multibeam scanning method
0
Edits on 16 Nov, 2022
"update inverses"
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edited on 16 Nov, 2022
Edits made to:
Infobox (+1 properties)
Infobox
Patent Citations Received
‌
US Patent 11501951 X-ray imaging in cross-section using un-cut lamella with background material
0
Edits on 22 Sep, 2022
"update citations for inverse infoboxes"
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edited on 22 Sep, 2022
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edited on 3 Aug, 2022
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Patent citations received
‌
US Patent 11404244 High-resolution x-ray spectroscopy surface material analysis
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"Entity importer update"
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Website URL
https://pdfpiw.uspto.gov/.piw?Docid=10825648
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 US Patent 10825648 Studying dynamic specimens in a transmission charged particle microscope

Infobox
Is a
Patent
Patent
Patent applicant
FEI Company
FEI Company
Current assignee
FEI Company
FEI Company
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
10825648
Date of patent
November 3, 2020
Patent application number
16364019
Date Filed
March 25, 2019
Patent citations
‌
US Patent 10014158 Innovative image processing in charged particle microscopy
‌
US Patent 10224174 Transmission charged particle microscope with imaging beam rotation
‌
US Patent 10446366 Imaging technique in scanning transmission charged particle microscopy
Patent primary examiner
‌
David A. Vanore

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