US Patent 10896114 Machine learning error prediction in storage arrays

Systems and methods for machine learning error prediction in storage arrays are described. In one embodiment, the method includes monitoring events of at least a first storage drive array, analyzing the monitored events using machine learning, identifying failure events based at least in part on the analysis and operating a prediction model engine to predict potential errors in storage drive arrays, the prediction model engine being built based at least in part on the analysis of the monitored events or the identifying of the failure events, or both.