Patent attributes
Techniques and technologies for automated microscopy scanning systems are disclosed wherein a microscopy system performs “hunt mode” operations at coarsely-spaced locations throughout a scanning window until an acceptable quality scan result is achieved. The system then performs detailed scans at all fields of view within a grid cell that includes the location having the acceptable scan result. The system performs another evaluation of the scan results for the entire grid cell, and if the scan results for the grid cell are collectively acceptable, then the system proceeds to perform “scan mode” operations. The scan mode operations include scanning and evaluating all of the fields of view within one or more grid cells adjacent to the acceptable grid cell from the hunt mode operations. The system may successively perform hunt mode operations and scan mode operations, compiling information regarding one or more aspects of the scanning process, until one or more termination criteria are satisfied.
