Log in
Enquire now
‌

US Patent 10983227 On-device metrology using target decomposition

Patent 10983227 was granted and assigned to KLA-Tencor on April, 2021 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
KLA-Tencor
KLA-Tencor
Date Filed
August 13, 2018
Date of Patent
April 20, 2021
Patent Applicant
KLA-Tencor
KLA-Tencor
Patent Application Number
16101521
Patent Citations Received
‌
US Patent 11610297 Tomography based semiconductor measurements using simplified models
0
Patent Inventor Names
John Hench
0
Alexander Kuznetsov
0
Antonio Arion Gellineau
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10983227
Patent Primary Examiner
John R. Lee
John R. Lee

Find more entities like US Patent 10983227 On-device metrology using target decomposition

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Golden Query Tool
Golden logo

Company

  • Home
  • Press & Media
  • Blog
  • Careers
  • WE'RE HIRING

Products

  • Knowledge Graph
  • Query Tool
  • Data Requests
  • Knowledge Storage
  • API
  • Pricing
  • Enterprise
  • ChatGPT Plugin

Legal

  • Terms of Service
  • Enterprise Terms of Service
  • Privacy Policy

Help

  • Help center
  • API Documentation
  • Contact Us