Patent 11004787 was granted and assigned to Toshiba Memory Corporation on May, 2021 by the United States Patent and Trademark Office.
A semiconductor chip includes a memory cell array and a wiring layer. The memory cell array includes a plurality of blocks arranged in a first direction along a surface of the semiconductor chip. The wiring layer includes a plurality of first pattern regions at different positions along the first direction, each first pattern region including a different pattern corresponding to one or more of the blocks. The first pattern regions can be used to identify portions of the semiconductor chip during analysis or the like.