US Patent 11015923 Measuring device and fabricating apparatus

A measuring device includes processing circuitry. The processing circuitry is configured to project a pattern light beam onto a measurement object; acquire, as measurement data, a projection image of the measurement object onto which the pattern light beam is projected; predict, using fabrication data for fabricating the measurement object, a probable image formed by projection of the pattern light beam onto the measurement object to form prediction data; correct the measurement data with the prediction data to form corrected data; and calculate three-dimensional data to the measurement object, using the corrected data.