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US Patent 11060856 Misalignment detection device and misalignment detection method

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Date Filed
December 21, 2018
Date of Patent
July 13, 2021
Patent Application Number
16963050
Patent Citations
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US Patent 10495581 Defect detection device and defect detection method
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US Patent 10613037 Inspection apparatus and inspection method
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US Patent 10658219 Workpiece holder, inspection apparatus, and workpiece position correction method
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US Patent 10690490 Method of detecting positional displacement of sample container, image capturing method employing same, and sample container positional displacement detecting device
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US Patent 10705029 Inspection apparatus and inspection method
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US Patent 10942131 Inspection apparatus and inspection method
‌
US Patent 10890443 Roundness measuring device, measurement guide system, and measurement guide method
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US Patent 10955358 Inspection method and inspection apparatus
‌
US Patent 10043276 Image processing method, image processing apparatus, robot apparatus, program, and recording medium
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US Patent 10417533 Selection of balanced-probe sites for 3-D alignment algorithms
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11060856
Patent Primary Examiner
‌
Gordon J Stock, Jr.

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