Patent attributes
The present invention discloses a signal skew measurement method for integrated circuit, a medium, and an electronic device. The method comprises: by a test machine, acquiring a first signal and a second signal output by an IC, respectively performing under-sampling on the first and second signals to obtain a first sampled signal and a second sampled signal; respectively performing digital conversion on the first and second sampled signals based on a preset threshold voltage to obtain a first digital signal and a second digital signal; respectively performing convolution on the first and second digital signals using a preset pulse signal to obtain a first comparison signal and a second comparison signal; and calculating a skew between the first and second comparison signals to obtain a reference skew, and determining a skew between the first and second signals according to the reference skew.
