US Patent 11172325 Method and system for location measurement analysis
Patent 11172325 was granted and assigned to Compology on November, 2021 by the United States Patent and Trademark Office.
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Patent abstract
A method for location measurement analysis, preferably including associating a location measurement with a geofence by receiving a location measurement, selecting candidate geofences, determining features, and/or classifying the location. A system for location measurement analysis, preferably including a computing system, and optionally including one or more containers and/or one or more location sensors associated with each container.
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Patent Number
111723250
Date of Patent
November 9, 2021
0Patent Application Number
202004300
Date Filed
April 30, 2020
0Official Website
Patent Primary Examiner
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Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
111723250
Date of Patent
November 9, 2021
0Patent Application Number
202004300
Date Filed
April 30, 2020
0Official Website
Patent Primary Examiner
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US Patent 11172325 Method and system for location measurement analysis
Infobox
Is a
Patent applicant
Current assignee
Patent jurisdiction
Patent number
11172325
Date of patent
November 9, 2021
Patent application number
20200430
Date Filed
April 30, 2020
Patent primary examiner
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