US Patent 11175128 Quality control of substrate coatings
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Patent abstract
The present invention relates to devices and methods for detecting the amount (degree, extent) of material coating a medical device or substrate, in particular the present invention relates to devices and methods for detecting the amount of vaccine material coating a microarray patch.
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Patent Inventor Names
Christopher Flaim0
Michael Carl Junger0
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Patent Jurisdiction
Patent Number
111751280
Date of Patent
November 16, 2021
0Patent Application Number
166220920
Date Filed
June 13, 2018
0Official Website
Patent Primary Examiner
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US Patent 11175128 Quality control of substrate coatings
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Is a
Patent jurisdiction
Patent number
11175128
Date of patent
November 16, 2021
Patent application number
16622092
Date Filed
June 13, 2018
Patent primary examiner
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