US Patent 11175306 Atomic force microscopy apparatus, methods, and applications
Patent 11175306 was granted and assigned to Cornell University Press on November, 2021 by the United States Patent and Trademark Office.
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Atomic force microscopy apparatus and method that enable observing charge generation transients with nanometer spatial resolution and nanosecond to picosecond time resolution, the timescale relevant for studying photo-generated charges in the world's highest efficiency photovoltaic films. The AFM apparatus includes an AFM, a light source for illumination of a sample operatively coupled to the AFM, a voltage source operatively coupled to the AFM, and a control circuitry operatively coupled to the light source and the voltage source. The AFM apparatus improves the time resolution and enables rapid acquisition of photocapacitance transients in a wide array of solar-energy-harvesting materials.
US Patent 11175306 Atomic force microscopy apparatus, methods, and applications
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