Patent attributes
In embodiments, an apparatus to predict failure of a laser is presented. The apparatus may include a memory to store a reference model of bias current change for a laser as a function of time and temperature, one or more sensors to detect: temperature, elapsed operating time and bias current of the laser, and a processor communicatively coupled to the memory and to the one or more sensors. The processor may be to calculate an actual bias current change ΔIA at a current laser temperature, and an expected bias current change ΔIE, based at least in part on the reference model and an average operating temperature, subtract ΔIE from ΔIA, and if the difference is greater than a pre-defined value α, output a signal. Related methods and non-transitory computer-readable media may also be presented.
