US Patent 11187525 Laser grid inspection of three-dimensional objects

A method, system, and computer program product for optical inspection of objects. The method projects an optical test line on a device under test. A frame is captured of the optical test line projected onto the device under test. The method provides a reference line for the device under test and compares the reference line and the optical test line within the frame. The method generates a visual quality determination based on the comparison of the reference line and the optical test line.