US Patent 11187723 Differential test probe

A high bandwidth differential test probe for measuring a device under test is provided. The test probe comprises a first probe tip arranged at a first coaxial connector relative to a first rotational axis, and a second probe tip arranged at a second coaxial connector relative to a second rotational axis. For adjusting the distance between the first probe tip and the second probe tip, the first coaxial connector is rotatable with respect to the first rotational axis and the second coaxial connector is rotatable with respect to the second rotational axis. Additionally, a tilt angle between the first probe tip and a plane comprising both the first and second rotational axes, and a tilt angle between the second probe tip and the plane, is not equal to zero.