US Patent 11187786 Array and module calibration with delay line
Patent 11187786 was granted and assigned to Raytheon on November, 2021 by the United States Patent and Trademark Office.
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Patent abstract
An apparatus and method for enhanced calibration of radar at the module level supports dual polarization and array calibration and alignment without the use of external test equipment. Utilizing a delay line, loop back capability at the module level allows existing receiver exciter subsystem to be used for calibration. This approach eliminates the need for manual array calibration using external RF monitor subsystem or external test antennas.
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Patent Inventor Names
David A. Ringheiser0
Debra J. Tonks0
Jack Lee0
Stephen M. Sparagna0
William Kennedy0
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Patent Applicant
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Patent Jurisdiction
Patent Number
111877860
Date of Patent
November 30, 2021
0Patent Application Number
164458850
Date Filed
June 19, 2019
0Official Website
Patent Primary Examiner
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US Patent 11187786 Array and module calibration with delay line
Infobox
Is a
Patent applicant
Current assignee
Patent jurisdiction
Patent number
11187786
Date of patent
November 30, 2021
Patent application number
16445885
Date Filed
June 19, 2019
Patent primary examiner
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