US Patent 11188448 Real-time defect analysis device

A defect analysis device configured for real-time monitoring of a user's interaction with an application running within a production environment and definition of a prioritization level of a defect identified in a module developed for integration into the application running within the production environment. The defect analysis device identifies new user flows through an application, and stores the underlying software classes used to facilitate a given task associated with the new user flows. In addition, the defect analysis device monitors software classes changed in a development environment, and matches the changed software classes to one or more flows, such that a prioritization level of the changed classes may be defined.