US Patent 11190419 Tunable-granularity multi-level histograms for efficient computer system metric analysis

Memory is identified for a first set of histogram buckets for a metric with bucket value ranges distributed according to a first function, and a second set of histogram buckets with bucket value ranges distributed according to a second function. The second set of buckets overlaps with a metric value range targeted for enhanced granularity analysis. After the histogram is updated in response to obtaining metric values, a representation of at least some of the buckets is sent to a destination.