Patent attributes
In some embodiments, a first image may be captured from a first field of view using a first exposure time. A second image may be captured from a second field of view using a second exposure time that is different than the first exposure time. An overlapping field of view may be defined by an overlapping portion of the first field of view and the second field of view. Histograms may be created for the first image and the second image, and possibly more images that include different exposure times and represent the overlapping field of view. The histograms may be analyzed to determine a presence or an absence of a light source in the overlapping field of view.