Log in
Enquire now
‌

US Patent 11243327 System and method for material characterization

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
0
Date Filed
May 30, 2017
0
Date of Patent
February 8, 2022
0
Patent Application Number
16305803
0
Patent Citations
‌
US Patent 10126154 Spectral analysis with spectrum deconvolution
‌
US Patent 10197511 X-ray CT apparatus and X-ray detector with variable layer
0
‌
US Patent 10215879 System for detecting counterfeit goods and method of operating the same
‌
US Patent 10217246 X-ray computed tomography apparatus and control method
‌
US Patent 10302578 Method for performing material decomposition using a dual-energy X-ray CT and corresponding dual-energy X-ray CT apparatus
‌
US Patent 10338012 Photon counting detector and X-ray computed tomography (CT) apparatus
‌
US Patent 10359375 Photon count-based radiation imaging system, method and device thereof
0
‌
US Patent 10401306 Combined image generation of article under examination and image of test item
0
‌
US Patent 10416342 Device and method for material characterization
‌
US Patent 10451568 Photon counting X-ray CT apparatus
•••
Patent Citations Received
‌
US Patent 11872071 Method for correcting a spectral image
0
‌
US Patent 11688057 Method and system for quickly matching image features applied to mine machine vision
0
‌
US Patent 11493457 Method and device for the X-ray inspection of products, in particular foodstuffs
0
Patent Inventor Names
Paul Scoullar
0
Syed Khusro Saleem
0
Christopher McLean
0
Shane Tonissen
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
11243327
0
Patent Primary Examiner
‌
Allen C. Ho
0

Find more entities like US Patent 11243327 System and method for material characterization

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
Open Query Tool
Access by API
Golden Query Tool
Golden logo