US Patent 11250268 Abnormality detection device and abnormality detection method
Patent 11250268 was granted and assigned to NEC on February, 2022 by the United States Patent and Trademark Office.
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Patent abstract
An image processing device (100) includes a change detection unit (101) that detects a target state change in a person on the basis of an input image, and a determination unit (102) that determines an abnormal state in accordance with a detection obtained by detecting occurrences of the target state change in a plurality of persons.
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Patent Inventor Names
Hiroo Ikeda0
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Patent Number
112502680
Date of Patent
February 15, 2022
0Patent Application Number
162986980
Date Filed
March 11, 2019
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US Patent 11250268 Abnormality detection device and abnormality detection method
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Is a
Patent applicant
Current assignee
Patent jurisdiction
Patent number
11250268
Date of patent
February 15, 2022
Patent application number
16298698
Date Filed
March 11, 2019
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