Patent 11266363 was granted and assigned to Rensselaer Polytechnic Institute on March, 2022 by the United States Patent and Trademark Office.
Systems and methods for obtaining scattering images during computed tomography (CT) imaging are provided. Two gratings or grating layers can be disposed between the object to be imaged and the detector, and the gratings or grating layers can be arranged such that primary X-rays are blocked while scattered X-rays that are deflected as they pass through the object to be imaged reach the detector to generate the scattering image.