US Patent 11275879 Method for detecting hazardous high impedance nets

A simulation method and a corresponding medium storing processor-executable code for detecting a high impedance net within an electronic circuit comprising a plurality of transistors is presented. The simulation method includes the step of connecting programmable resistors between two terminals of each transistor. Subsequently, voltage fluctuations are determined at the first terminals of a first group of transistors, where the voltage fluctuations are caused by connecting the programmable resistors. By connecting current sources with the first terminals of the first group of transistors, a potentially hazardous high impedance net may be detected within the electronic circuit.