US Patent 11308667 Chart erratum and refactoring

A computer-implemented method is provided. The embodiments include evaluating, by one or more processors, a specimen chart relative to a chart erratum model that has features mapped to an optimum state for a first chart type. The method also includes generating a first risk score for a first sample feature of the specimen chart. The first risk score may include a delta from the optimum state. The method also includes refactoring the specimen chart to mitigate the first risk score of the first sample feature.