US Patent 11321620 Method and system to detect undefined anomalies in processes

The present subject matter describes a method to detect anomaly in an environment based on AI techniques. The method comprises receiving one or more data representations of one or more objects present in an environment. A first-type of information is captured from a first-area within the one or more data representations. A second-type of information from a second-area different than the first area in the data representations is also captured. A third information is generated from the first information, said third information corresponding to predicted information for the second area using one or more artificial-intelligence models for evaluating the second information. The third information is compared with the second information to determine abnormality with respect to state or operation of one or more objects within the environment.