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US Patent 11327111 Environment control apparatus and chip testing system
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Is a
Patent
Date Filed
November 30, 2020
Date of Patent
May 10, 2022
Patent Application Number
17106186
Patent Citations
US Patent 10726183 Testing apparatus
Patent Citations Received
US Patent 11940478 Electronic device characterization systems and methods
0
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
11327111
Patent Primary Examiner
Jermele M Hollington
CPC Code
G01R 31/2863
G01R 31/2868
G01R 31/2872
G01R 31/28
G01R 31/2875
G01R 31/2877
G01R 31/2881
G01R 31/2874
G01R 31/2862
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