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US Patent 11353410 Material testing machine and radiation CT device
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Patent
Date Filed
September 12, 2019
Date of Patent
June 7, 2022
Patent Application Number
16568881
Patent Citations
US Patent 10247682 Helical computed tomography
US Patent 10996355 Method and arrangement for detector correction for generating object radiographs
US Patent 11002690 X-ray CT device
US Patent 11009449 Scanning trajectories for region-of-interest tomograph
US Patent 11009471 Dynamic radiation collimation for non destructive analysis of test objects
US Patent 11016038 Measurement processing device, measurement processing method, measurement processing program, and method for manufacturing structure
US Patent 11020071 X-ray computed tomography apparatus with scanner function
US Patent 11037337 Method and apparatus for generating measurement plan for measuring X-ray CT
US Patent 11138767 System and method for the proscriptive determination of parameters for iterative reconstruction
US Patent 11175242 Geometric alignment, sample motion correction, and intensity normalization of computed tomography projections using pi-line optimization
•••
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
11353410
Patent Primary Examiner
Allen C. Ho
CPC Code
G01N 23/06
G01N 23/083
G01N 23/087
G01N 23/18
G01N 23/046
G01N 23/04
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