US Patent 11385138 Laboratory testing-based valve prognostics

The claimed method and system develops a useful lifetime profile for a component of a process control device, such as a valve, and uses that lifetime profile to determine a projected remaining lifetime for the device component in operation. The lifetime profile is developed from using real world operational data of similar process control devices, used under substantially the same operating conditions as to be experienced during operation. Profiles may be developed for numerous device components, from which a projected lifetime profile for the entire process control device is developed. Based on the projected remaining lifetime, notification warnings may be sent to remote computers and maintenance scheduling may be automatically achieved.