US Patent 11415617 Field-biased second harmonic generation metrology
Patent 11415617 was granted and assigned to Femtometrix, Inc. on August, 2022 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
December 4, 2019
0
Date of Patent
August 16, 2022
0
Patent Applicant
Patent Application Number
16703709
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Patent Citations
Patent Citations Received
Patent Inventor Names
Marc Kryger
0
Viktor Koldiaev
0
John Changala
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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