US Patent 11419247 Controlling a working condition of electronic devices

An approach for controlling a working condition of electronic devices via controlling a climate parameter. The approach comprises measuring a climate parameter distribution; feeding the climate parameter distribution to a climate control system; obtaining operational data from each of the electronic devices; feeding the operational data into the climate control system to determine control actions; obtaining activity data about external activities; providing a machine learning algorithm trained with past activity data; feeding new activity data to the machine learning algorithm; feeding the prediction output to the climate control system; generating a current climate map; generating a target climate map; and generating a rearrangement plan with rearrangement steps for the electronic devices.