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US Patent 11437218 Apparatus and method for nanoscale X-ray imaging

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Current Assignee
Massachusetts Institute of Technology
Massachusetts Institute of Technology
Date Filed
September 14, 2020
Date of Patent
September 6, 2022
Patent Applicant
Massachusetts Institute of Technology
Massachusetts Institute of Technology
Patent Application Number
17020734
Patent Citations
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US Patent 10591424 X-ray tomographic inspection systems for the identification of specific target items
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US Patent 10045752 Method for coded-source phase contrast X-ray imaging
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US Patent 10068740 Distributed, field emission-based X-ray source for phase contrast imaging
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US Patent 10229951 Photosensitive imaging devices and associated methods
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US Patent 10748956 Photosensitive imaging devices and associated methods
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11437218
Patent Primary Examiner
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Nicole M Ippolito
CPC Code
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H01J 37/256
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H01J 2237/2004
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H01J 2237/20207
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H01J 37/28
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G01N 23/044
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G01N 23/2252
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H01J 2237/2807
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H01J 37/244

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