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US Patent 11442108 Isolation logic test circuit and associated test method
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Patent
Date Filed
September 16, 2021
Date of Patent
September 13, 2022
Patent Application Number
17477237
Patent Citations
US Patent 11047909 Inter-domain power element testing using scan
US Patent 10955472 Yield-oriented design-for-test in power-switchable cores
US Patent 10310013 Test mode isolation and power reduction in embedded core-based digital systems of integrated circuits (ICs) with multiple power domains
Patent Citations Received
US Patent 12124309 Fault detection during entry to or exit from low power mode
0
US Patent 12063036 Power application circuit
0
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
11442108
Patent Primary Examiner
Cynthia Britt
CPC Code
G01R 31/318575
G01R 31/31713
G01R 31/318555
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