US Patent 11449409 Schema inference and log data validation system

Systems and methods are described for generating metrics from log data items, automatically inferring one or more schemas based at least in part on analyzing samples of the log data items, validating samples of the log data items against the one or more schemas to detect log data item errors, and analyzing the log data item errors according to metrics analytics rules to determine an effect of the log data item errors on a quality measurement of the metrics.