Patent attributes
Methods, apparatuses and systems directed to pattern learning, recognition, and metrology. In some particular implementations, the invention provides a flexible pattern recognition platform including pattern recognition engines that can be dynamically adjusted to implement specific pattern recognition configurations for individual pattern recognition applications. In certain implementations, the present invention provides for methods and systems suitable for analyzing and recognizing patterns in biological signals such as multi-electrode array waveform data. In other implementations, the present invention also provides for a partition configuration where knowledge elements can be grouped and pattern recognition operations can be individually configured and arranged to allow for multi-level pattern recognition schemes. In other implementations, the present invention provides methods and systems for dynamic learning of patterns in supervised and unsupervised manners.
