Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
October 18, 2022
Patent Application Number
16043424
Date Filed
July 24, 2018
Patent Citations
Patent Primary Examiner
EC film stacks and different layers within the EC film stacks are disclosed. Methods of manufacturing these layers are also disclosed. In one embodiment, an EC layer comprises nanostructured EC layer. These layers may be manufactured by various methods, including, including, but not limited to glancing angle deposition, oblique angle deposition, electrophoresis, electrolyte deposition, and atomic layer deposition. The nanostructured EC layers have a high specific surface area, improved response times, and higher color efficiency.
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