US Patent 11500100 Time-of-flight measurements using linear inverse function

One example provides a time-of-flight depth imaging system configured to modulate light emitted from a light source to illuminate an environment with modulated light, and for each of one or more modulation frequencies, integrate an image at each phase step of a plurality of phase steps, and sense a temperature of the light source and/or image sensor via one or more temperature sensors to acquire a measured temperature. The instructions are further executable to, and for each pixel of one or more pixels of the image sensor, determine a complex phasor based upon the measured temperature using a linear inverse function for each modulation frequency, determine a phase shift between the light emitted from the light source and light from the light source reflected back by the environment based on the complex phasor, and output a depth value for the pixel based upon the phase shift.