US Patent 11537459 Automatically predicting device failure using machine learning techniques

Methods, apparatus, and processor-readable storage media for automatically predicting device failure using machine learning techniques are provided herein. An example computer-implemented method includes obtaining telemetry data from at least one client device; predicting failure of at least a portion of the at least one client device by processing at least a portion of the telemetry data using a first set of one or more machine learning techniques; predicting lifespan information pertaining to at least a portion of the at least one client device by processing the predicted failure and at least a portion of the telemetry data using a second set of one or more machine learning techniques; and performing at least one automated action based at least in part on one or more of the predicted failure and the predicted lifespan information.